3. a) Draw a schematic diagram of anX-ray diffractometer. [4 marks]
b) The results of an X-ray diffraction experiment that usedX-rays of wavelength 0.154 nm show the first 6 peaks at angles of40.6°, 58.8°, 73.8°, 87.8°, 101.8°, and 116.4°.
i) Use this information to determinethe possible crystal structures of the sample. [10 marks]
ii) An additional scan was performedon the sample and an additional peak was observed at an angle of133.2°. Determine the crystal structure of the sample. [3marks]
iii) Calculate the Miller indices foreach of the measured peaks. [7 marks]
iv) Draw the orientation of thecrystal plane within the unit cell corresponding to the peak at101.8°. [3 marks]
v) Calculate the lattice constant andidentify the sample. [3 marks]
