SRAM Assist Techniques for Operation in a Wide Voltage Range in
28-nm CMOS. show the some...
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Electrical Engineering
SRAM Assist Techniques for Operation in a Wide Voltage Range in28-nm CMOS. show the some simulation results .
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Sram Assist techniques 1Important sampling Monte Carlo simulations can be used to measure the effect of variability but an unfeasible number of simulations would be required to find a rare failure event IS enables enormous speedup for Monte Carlo analysis of rare eventsUnder the assumption that threshold voltage deviations due to random dopant fluctuation can be modeled with a Gaussian distribution Monte Carlo will simulate the twodevice circuit with threshold probability density functions PDF given by Y1 and Y2
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